List of Contributors

  • David A. Ackerman SRI Sarnoff, Princeton, NJ, USA
  • Sarah E. Baker University of Notre Dame, Notre Dame, IN, USA
  • Algirdas Bastys Vilnius University, Vilnius, Lithuania
  • Vishnu Naresh Boddeti Carnegie Mellon University, Pittsburgh, PA, USA
  • Kevin W. Bowyer University of Notre Dame, Notre Dame, IN, USA
  • Mark J. Burge The MITRE Corporation, McLean, VA, USA
  • Rama Chellappa University of Maryland, College Park, MD, USA
  • Antwan D. Clark University of Maryland, College Park, MD, USA
  • Ryan Connaughton University of Notre Dame, Notre Dame, IN, USA
  • John Daugman Computer Laboratory, University of Cambridge, Cambridge, UK
  • Patrick J. Flynn University of Notre Dame, Notre Dame, IN, USA
  • Patrick Grother National Institute of Standards and Technology, Gaithersburg, MD, USA
  • Isom H. Herron Rensselaer Polytechnic Institute, Troy, NY, USA
  • Karen P. Hollingsworth University of Notre Dame, IN, USA
  • Xiaofei Hu Wake Forest University, Winston-Salem, NC, USA
  • Raghavender Jillela West Virginia University, Morgantown, WV, USA
  • Mohamed Kamel University of Waterloo, Waterloo, ON, Canada
  • Josh Klontz The MITRE Corporation, McLean, VA, USA
  • Adams Wai Kin Kong Nanyang Technological University, Singapore, Singapore
  • Justas Kranauskas Vilnius University, Vilnius, Lithuania
  • Volker Krüger Aalborg University, Aalborg, Denmark
  • Scott A. Kulp Rutgers University, Piscataway, NJ, USA
  • Matthew Monaco Noblis, Falls Church, VA, USA
  • Francesco Nicolo West Virginia University, Morgantown, WV, USA
  • Paúl Pauca Wake Forest University, Winston-Salem, NC, USA
  • Vishal M. Patel University of Maryland, College Park, MD, USA
  • P. Jonathon Phillips National Institute of Standards and Technology, Gaithersburg, MD, USA
  • Robert Plemmons Wake Forest University, Winston-Salem, NC, USA
  • Jaishanker K. Pillai University of Maryland, College Park, MD, USA
  • Hugo Proença University of Beira, Instituto de Telecomunicações, Covilhã, Portugal
  • George Quinn National Institute of Standards and Technology, Gaithersburg, MD, USA
  • Nalini K. Ratha IBM Watson Research Center, Hawthorne, NY, USA
  • Arun A. Ross West Virginia University, Morgantown, WV, USA
  • Marios Savvides Carnegie Mellon University, Pittsburgh, PA, USA
  • Natalia A. Schmid West Virginia University, Morgantown, WV, USA
  • Jonathon M. Smereka Carnegie Mellon University, Pittsburgh, PA, USA
  • Elham Tabassi National Institute of Standards and Technology, Gaithersburg, MD, USA
  • Jason Thornton MIT Lincoln Laboratory, Lexington, MA, USA
  • Shreyas Venugopalan Carnegie Mellon University, Pittsburgh, PA, USA
  • B.V.K. Vijaya Kumar Carnegie Mellon University, Pittsburgh, PA, USA
  • Harry Wechsler George Mason University, Fairfax, VA, USA
  • David Zhang The Hong Kong Polytechnic University Kowloon, Kowloon, Hong Kong
  • Jinyu Zuo West Virginia University, Morgantown, WV, USA
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